发明名称 |
METAL-INSULATOR-METAL CAPACITOR MANUFACTURED USING ETCHBACK |
摘要 |
<p>The invention provides a method for manufacturing a metal-insulator-metal (MIM) capacitor, a method for manufacturing an integrated circuit having a metal-insulator-metal (MIM) capacitor, and an integrated circuit having a metal-insulator-metal (MIM) capacitor. The method for manufacturing the metal-insulator-metal (MIM) capacitor, among other steps and without limitation, includes providing a material layer (185) on a substrate (110), and forming a refractory metal layer (210) having a thickness (t<SUB>1</SUB>) on the substrate, at least a portion of the refractory metal layer extending over the material layer. The method further includes reducing the thickness (t<SUB>2</SUB>) of the portion of the refractory metal layer (210) extending over the material layer, thereby forming a thinned refractory metal layer (310), and reacting the thinned refractory metal layer (310) with at least a portion of the material layer to form an electrode for use in a capacitor.</p> |
申请公布号 |
WO2006094280(A3) |
申请公布日期 |
2007.01.18 |
申请号 |
WO2006US08032 |
申请日期 |
2006.03.03 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED;PHAN, TONY, THANH;MOLLAT, MARTIN, B. |
发明人 |
PHAN, TONY, THANH;MOLLAT, MARTIN, B. |
分类号 |
H01L21/8242;H01L21/20;H01L27/108;H01L29/00 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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