发明名称 CHARGED PARTICLE BEAM APPLICATION DEVICE
摘要 PROBLEM TO BE SOLVED: To enable measurement of a landing angle in a multi-electron beam type exposure device of a low current value per a beam, and enable high precision of the landing angle absolute value and the relative landing angle with a high SN ratio in a charged particle beam application device. SOLUTION: In a transmission type detector of a combination of two sheets of throttling plates (first throttling 6a and second throttling 6b) and a detector 6c, it has a structure that a detection prospective angle decided from a spacing h between the first throttling 6a and the second throttling 6b and an opening diameter d of the second throttling 6b is made to nearly coincide with an opening angle of the measured electron beam 10, or that the detection prospective angle a is made to be smaller than the opening angle, and the landing angle is decided from the relationship between the micro-opening 11 center of the first throttling and the opening 12 center of the second throttling in which the detected current value becomes the maximum. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007012290(A) 申请公布日期 2007.01.18
申请号 JP20050187807 申请日期 2005.06.28
申请人 HITACHI HIGH-TECHNOLOGIES CORP;CANON INC 发明人 KAMIMURA OSAMU;KARESUE TADASHI;HAYATA YASUNARI;GOTO SUSUMU
分类号 H01J37/244;G03F7/20;H01J37/09;H01L21/027 主分类号 H01J37/244
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