发明名称 Methods for forming interconnect structures
摘要 A method for forming an interconnect structure. A substrate is provided with a low-k dielectric layer thereon. At least one conductive feature is then formed in the low-k dielectric layer. A cap layer is formed overlying the low-k dielectric layer, and the conductive feature and the low-k dielectric layer is then subjected to an energy source to reduce a dielectric constant thereof.
申请公布号 US2007015355(A1) 申请公布日期 2007.01.18
申请号 US20050179265 申请日期 2005.07.12
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIN KENG-CHU;KO CHUNG-CHI;LIAO YI-CHI
分类号 H01L21/469 主分类号 H01L21/469
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