发明名称 |
THERMAL TYPE TRIPPING DEVICE AND CIRCUIT BREAKER USING THE SAME |
摘要 |
A thermal type tripping device adapted to trip a circuit in that a bimetal (2) is heated by overcurrent to cause the curving of the bimetal (2), wherein at least part of the surface of the bimetal (2) has a black color or matte black color (7). This makes it possible to measure the temperature of the bimetal (2) with high accuracy by using a non-contact type thermometer. Further, the temperature measuring section (8) of the bimetal is provided with a bend process section (11) whose surface has a matte black color. ® KIPO & WIPO 2007
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申请公布号 |
KR20070008596(A) |
申请公布日期 |
2007.01.17 |
申请号 |
KR20067019303 |
申请日期 |
2006.09.19 |
申请人 |
MITSUBISHI ELECTRIC CORPORATION |
发明人 |
KAWAMURA KOUJI;AKITA HIROYUKI;MURAI MASATOSHI;YONEZAWA HIROTOSHI;NAITO SATORU |
分类号 |
H01H71/16;H01H71/10 |
主分类号 |
H01H71/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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