发明名称 THERMAL TYPE TRIPPING DEVICE AND CIRCUIT BREAKER USING THE SAME
摘要 A thermal type tripping device adapted to trip a circuit in that a bimetal (2) is heated by overcurrent to cause the curving of the bimetal (2), wherein at least part of the surface of the bimetal (2) has a black color or matte black color (7). This makes it possible to measure the temperature of the bimetal (2) with high accuracy by using a non-contact type thermometer. Further, the temperature measuring section (8) of the bimetal is provided with a bend process section (11) whose surface has a matte black color. ® KIPO & WIPO 2007
申请公布号 KR20070008596(A) 申请公布日期 2007.01.17
申请号 KR20067019303 申请日期 2006.09.19
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 KAWAMURA KOUJI;AKITA HIROYUKI;MURAI MASATOSHI;YONEZAWA HIROTOSHI;NAITO SATORU
分类号 H01H71/16;H01H71/10 主分类号 H01H71/16
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