发明名称 |
METHOD OF FORMING TUNGSTEN LAYER HAVING LOW RESISTANCE |
摘要 |
A method for forming a low-resistance tungsten layer is provided to reduce resistance of a tungsten layer by depositing the tungsten layer on a smooth surface of a lower surface such as an adhesion layer and a barrier layer. An interlayer dielectric(108) is formed on a semiconductor substrate(100). The interlayer dielectric is etched to form contact holes(104,110) exposing a predetermined portion of the semiconductor substrate. A barrier layer(115) is disposed in the contact hole to form a tungsten contact plug(116a). An adhesive layer(118) is formed on the interlayer dielectric and the tungsten contact plug. The adhesive layer is partially etched-back to smooth the surface of the adhesive layer. A tungsten wire is formed on the adhesive layer having the smooth surface.
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申请公布号 |
KR20070008108(A) |
申请公布日期 |
2007.01.17 |
申请号 |
KR20050063063 |
申请日期 |
2005.07.13 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, RAK HWAN;KIM, YOUNG CHEON |
分类号 |
H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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