发明名称 Schottky diode with durable contact on silicon carbide and method of fabrication
摘要 <p>A Schottky barrier silicon carbide device has a Re Schottky metal contact. The Re contact 27 is thicker than 250 Angstroms and may be between 2000 and 4000 Angstroms. A termination structure is provided by ion milling an annular region around the Schottky contact.</p>
申请公布号 EP1743373(A2) 申请公布日期 2007.01.17
申请号 EP20050725831 申请日期 2005.03.18
申请人 FAIRCHILD SEMICONDUCTOR CORPORATION 发明人 SENG, WILLIAM, F.;WOODIN, RICHARD, L.
分类号 H01L29/872;H01L21/04;H01L29/24;H01L29/47;H01L29/812;H01L31/0312 主分类号 H01L29/872
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