发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <p>A semiconductor device and a manufacturing method thereof are provided to improve contact resistance between a storage node electrode and a storage node contact plug due to a conductive pattern by protecting the storage node contact plug and the conductive pattern upon etching a mold layer with a bit line spacer and a separation layer. A semiconductor structure has a contact pad(132). A composite layer is formed on the semiconductor structure and includes a first interlayer dielectric(124), an isolation layer(146), and a second interlayer dielectric(134) having a contact hole. The contact hole exposes the contact pad. A spacer(152) is formed on an inner wall of the contact hole. A contact plug(154) is formed on the contact pad in the contact hole. The contact plug has an upper surface lower than an upper surface of the composite layer. Conductive pads are formed on sidewalls of the contact plug and an upper portion of the spacer in the contact hole. A storage node electrode(172) is formed on the conductive pad.</p>
申请公布号 KR20070007491(A) 申请公布日期 2007.01.16
申请号 KR20050062141 申请日期 2005.07.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SONG, JONG HEUI;SEO, JUN;YOON, KUK HAN
分类号 H01L21/027 主分类号 H01L21/027
代理机构 代理人
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