发明名称 NON-VOLATILE MEMORY DEVICES AND METHODS OF FORMING THE SAME
摘要 <p>A nonvolatile memory device and its forming method are provided to minimize the distance between adjacent nonvolatile memory cells by isolating electrically first and second active regions from each other using a cell isolation pattern. A cell isolation pattern(105a) and a semiconductor pattern(110a) are sequentially stacked on a predetermined region of a semiconductor substrate(100). A cell gate line(165a) is formed at one side of the semiconductor pattern and the cell isolation pattern on the substrate. A multilayer trap insulating layer(160) is interposed between the cell gate line and the substrate and between the cell gate line and the semiconductor pattern. A first doped layer is formed at both sides of the cell gate line in the substrate. A second doped layer is formed at both sides of the cell gate line in the substrate.</p>
申请公布号 KR100669353(B1) 申请公布日期 2007.01.16
申请号 KR20050097031 申请日期 2005.10.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, BYUNG YONG;LEE, CHOONG HO;PARK, DONG GUN
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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