| 摘要 |
A built-in self test circuit having multiple output levels is provided to obtain address information of a cell having an error and to easily detect which test item is related to the error, and to easily transfer the error information by using a voltage level without an additional pin. A test item-voltage table(351) has voltage level information corresponding to n test items one to one. A multiple level generator(353) outputs an error generation signal having the voltage level corresponding to the test item with an error, referring to the test-item voltage table, when an error occurs during the test. The multiple level generator includes a voltage divider to generate n-divided voltages of a logic voltage level.
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