发明名称 |
Method for manufacturing semiconductor integrated circuit structures |
摘要 |
A method for manufacturing circuit structures integrated in a semiconductor substrate that includes regions, in particular isolation regions, includes the steps of:-depositing a conductive layer to be patterned onto the semiconductor substrate;-forming a first mask of a first material on the conductive layer;-forming a second mask made of a second material that is different from the first and provided with first openings of a first size having spacers formed on their sidewalls to uncover portions of the first mask having a second width which is smaller than the first;-partly etching away the conductive layer through the first and second masks such to leave grooves of the second width;-removing the second mask and the spacers; and-etching the grooves through the first mask to uncover the regions provided in the substrate and form conductive lines.
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申请公布号 |
US7163898(B2) |
申请公布日期 |
2007.01.16 |
申请号 |
US20030631463 |
申请日期 |
2003.07.30 |
申请人 |
STMICROELECTRONICS S.R.L. |
发明人 |
MARIANI MARCELLO;BEGHIN LORENA |
分类号 |
H01L21/302;H01L21/033;H01L21/3213 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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