发明名称 Method for manufacturing semiconductor integrated circuit structures
摘要 A method for manufacturing circuit structures integrated in a semiconductor substrate that includes regions, in particular isolation regions, includes the steps of:-depositing a conductive layer to be patterned onto the semiconductor substrate;-forming a first mask of a first material on the conductive layer;-forming a second mask made of a second material that is different from the first and provided with first openings of a first size having spacers formed on their sidewalls to uncover portions of the first mask having a second width which is smaller than the first;-partly etching away the conductive layer through the first and second masks such to leave grooves of the second width;-removing the second mask and the spacers; and-etching the grooves through the first mask to uncover the regions provided in the substrate and form conductive lines.
申请公布号 US7163898(B2) 申请公布日期 2007.01.16
申请号 US20030631463 申请日期 2003.07.30
申请人 STMICROELECTRONICS S.R.L. 发明人 MARIANI MARCELLO;BEGHIN LORENA
分类号 H01L21/302;H01L21/033;H01L21/3213 主分类号 H01L21/302
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