发明名称 Semiconductor memory devices and methods for fabricating the same
摘要 Methods and structures are provided for a dual-bit EEPROM semiconductor device. The dual-bit memory device comprises a semiconductor substrate, a tunnel oxide disposed on the semiconductor substrate and first and second spaced apart floating gates that are disposed on the tunnel oxide. An interlayer dielectric layer contacts the tunnel oxide layer at a position between the first and second spaced apart floating gates and electrically isolates the first and second spaced apart floating gates. A control gate contacts the interlayer dielectric layer between the first and second spaced apart floating gates.
申请公布号 US7163862(B1) 申请公布日期 2007.01.16
申请号 US20050243752 申请日期 2005.10.04
申请人 SPANSION, LLC 发明人 WISEMAN JOSEPH WILLIAM;DAWSON ROBERT;HIGGINS, SR. KELLEY KYLE;SONG SHENGNIAN
分类号 H01L21/8247 主分类号 H01L21/8247
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