发明名称 PROBE ASSEMBLY
摘要 A probe assembly is provided to effectively install probes to a guide block by using self-elastic force of the probe and to improve reliability in inspecting a display panel by minimizing leak current by increasing signal transfer efficiency. A probe block for inspecting a flat panel display includes: a guide block(132) having slots formed on the upper and lower sides at a predetermined width and probes(150) positioned at the lateral side of the guide block and composed of a connecting beam unit(154); a first elastic beam unit(152) bent and extended from one end of the connecting beam unit, fitted and fixed to the slot formed at the lower side of the guide block, and provided with a first contact end(152b) contacted with a pattern of an object; and a second elastic beam unit(156) bent and extended from the other end of the connecting beam unit in parallel with the first elastic beam unit and fitted and fixed to the slot formed on the upper side of the guide block.
申请公布号 KR100669827(B1) 申请公布日期 2007.01.16
申请号 KR20050073316 申请日期 2005.08.10
申请人 PHICOM CORP. 发明人 SHIN, DONG WON;KIM, SEOK JUNG
分类号 G01R1/073 主分类号 G01R1/073
代理机构 代理人
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