SEMICONDUCTOR DEVICE, TEST BOARD, TEST SYSTEM OF SEMICONDUCTOR DEVICE, AND TEST METHOD OF SEMICONDUCTOR DEVICE

摘要

A semiconductor device, a test board, and a test system and method for the semiconductor device are provided to cut down the test cost by testing the high-speed semiconductor device with a low-speed tester and to increase reliability in the test result by not using a complex circuit. A semiconductor device(1) includes an input stage(100) to which test pattern data is input in series at a first speed, and an output stage(300) corresponding to the input stage and outputting the test pattern data to the outside in series at a second speed different from the first speed, wherein the second speed is faster than the first speed in a first test mode and slower in a second test mode.