发明名称 |
METHOD OF ETCHING COMB ELECTRODES BY SELF-ALIGNMENT |
摘要 |
A self-aligned comb electrode etching method is provided to decrease an alignment error between upper and lower structures of a MEMS(Micro Electro-Mechanical System) structure and to precisely form a gap between comb electrodes. A method for etching a fixed comb electrode formed on a first silicon layer(401) of an SOI(Silicon-On-Insulator) substrate(400) and a drive comb electrode formed on a second silicon layer(403) of the substrate includes steps of: forming a first mask on the part of the first silicon layer where the fixed comb electrode is formed, a second mask on the position where the drive comb electrode is formed, and an oxidization preventing layer(S) on a region correspondent to the fixed comb electrode part of the second silicon layer; etching the first silicon layer exposed to the second mask to a predetermined depth; removing the second mask, etching the first silicon layer exposed to the first mask, and leaving a first part of the first silicon layer of the predetermined height on the drive comb electrode part; etching an insulating layer(402) of the substrate exposed to the first mask and the first part; etching the second silicon layer exposed to the first mask and the first part; removing the first mask and forming a silicon oxide layer on the exposed silicon layer; removing the oxidization preventing layer and etching the silicon layer formed under the oxidization preventing layer; and removing the silicon oxide layer.
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申请公布号 |
KR100668349(B1) |
申请公布日期 |
2007.01.12 |
申请号 |
KR20050116637 |
申请日期 |
2005.12.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KO, YOUNG CHUL;JEONG, HYUN KU;CHUNG, SEOK WHAN |
分类号 |
G02B26/08;G02B26/00 |
主分类号 |
G02B26/08 |
代理机构 |
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主权项 |
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地址 |
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