发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
摘要 Disclosed is a semiconductor device comprising a lower wiring layer (first metal layer) (16) formed on a semiconductor substrate, an interlayer insulating film (22) formed on the lower wiring layer (16), a plug metal (26) which is formed in a contact hole (opening) formed in the interlayer insulating film (22) in contact with the lower wiring layer (foundation layer) (16) and connected with the lower wiring layer (16), and a first barrier layer (24) formed between the plug metal (26) and the interlayer insulating film (22) and having a chemical composition different from that of the lower wiring layer (foundation layer). Also disclosed is a method for manufacturing such a semiconductor device. In this semiconductor device, the contact resistance between the plug metal (26) and the lower wiring layer (16) can be reduced.
申请公布号 WO2007004256(A1) 申请公布日期 2007.01.11
申请号 WO2005JP12059 申请日期 2005.06.30
申请人 SPANSION LLC;SPANSION JAPAN LIMITED;ENDA, TAKAYUKI;MORIYA, MASAYUKI 发明人 ENDA, TAKAYUKI;MORIYA, MASAYUKI
分类号 H01L21/28;H01L21/288 主分类号 H01L21/28
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