发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME |
摘要 |
Disclosed is a semiconductor device comprising a lower wiring layer (first metal layer) (16) formed on a semiconductor substrate, an interlayer insulating film (22) formed on the lower wiring layer (16), a plug metal (26) which is formed in a contact hole (opening) formed in the interlayer insulating film (22) in contact with the lower wiring layer (foundation layer) (16) and connected with the lower wiring layer (16), and a first barrier layer (24) formed between the plug metal (26) and the interlayer insulating film (22) and having a chemical composition different from that of the lower wiring layer (foundation layer). Also disclosed is a method for manufacturing such a semiconductor device. In this semiconductor device, the contact resistance between the plug metal (26) and the lower wiring layer (16) can be reduced. |
申请公布号 |
WO2007004256(A1) |
申请公布日期 |
2007.01.11 |
申请号 |
WO2005JP12059 |
申请日期 |
2005.06.30 |
申请人 |
SPANSION LLC;SPANSION JAPAN LIMITED;ENDA, TAKAYUKI;MORIYA, MASAYUKI |
发明人 |
ENDA, TAKAYUKI;MORIYA, MASAYUKI |
分类号 |
H01L21/28;H01L21/288 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|