| 摘要 |
PROBLEM TO BE SOLVED: To prevent the occurrence of failures when writing or deleting trimming data beforehand. SOLUTION: The integrated circuit 1A has: a functional circuit block 2; a nonvolatile memory 3 into which trimming data are stored during the trimming of the functional circuit block 2; a diode D for detecting the excessive temperature rise, in which either one node of a cathode and an anode is connected to a control line WL connected to a gate of a memory transistor 3A in the nonvolatile memory 3; and a voltage applying means (two external lead terminals 10A, 10C) for making the other node of the diode D in an open state when the trimming data are stored, and also, for applying, between the control line WL and the other node, a forward bias voltage Vfb which has a value of turning off the diode D at a proper temperature range or turning on the diode D at the excessive temperature rise, when the excessive temperature rise is detected. The integrated circuit 1A can detect the excessive temperature rise by a current flowing in the voltage applying means. COPYRIGHT: (C)2007,JPO&INPIT
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