发明名称 Inspection system and apparatus
摘要 A method and system for identifying a defect or contamination on a surface of a sample. The system operates by detecting changes in work function across a surface via both vCPD and nvCPD. It utilizes a non-vibrating contact potential difference (nvCPD) sensor for imaging work function variations over an entire sample. The data is differential in that it represents changes in the work function (or geometry or surface voltage) across the surface of a sample. A vCPD probe is used to determine absolute CPD data for specific points on the surface of the sample. The combination of vibrating and non-vibrating CPD measurement modes allows the rapid imaging of whole-sample uniformity, and the ability to detect the absolute work function at one or more points.
申请公布号 US2007010954(A1) 申请公布日期 2007.01.11
申请号 US20060519501 申请日期 2006.09.12
申请人 QCEPT TECHNOLOGIES, INC. 发明人 STEELE M. B.;HAWTHORNE JEFFREY A.
分类号 G06F19/00;G01B5/28;G01B5/30;G01N27/00;G01N33/00 主分类号 G06F19/00
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