发明名称 System and method for automated workload characterization of an application server
摘要 An application server may be instrumented to provide a resource measurement framework to collect resource usage data regarding request processing by the application server and applications executing on the application server. The resource measurement framework of an application server may collect hardware and software resource usage data regarding request processing at interception points located at interfaces between application components and services or other components of the application server by instrumenting those interfaces. The resource measurement framework may collect resource usage by instrumenting standard interfaces and/or methods of various specifications, such as implemented by containers or other components of the application server. Thus, the resource measurement framework may collect resource usage for applications or application components that do not include any resource measuring capabilities. The collected resource usage data may be parsed and combined to create an overall characterization of resource usage corresponding to the application server's request processing.
申请公布号 US2007011330(A1) 申请公布日期 2007.01.11
申请号 US20060346900 申请日期 2006.02.03
申请人 SUN MICROSYSTEMS, INC. 发明人 DINKER DARPAN;SCHWETMAN HERBERT D.;BONEBAKKER JAN L.
分类号 G06F15/173 主分类号 G06F15/173
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