发明名称 MICROCHIP INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an energy saving type microchip inspection device. SOLUTION: This microchip inspection device of emitting light to a microchip storing a specimen to carry out measurement has a casing, a light source part for irradiating the microchip with the light of a prescribed wavelength, a chip holder attached with the microchip, and a photoreception part for receiving light emitted from the microchip, the microchip inspection device is provided with a heat transfer means for transferring heat radiated from the light source part to the chip holder, and the microchip is brought thereby into a prescribed temperature, in the microchip inspection device. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007003409(A) 申请公布日期 2007.01.11
申请号 JP20050185137 申请日期 2005.06.24
申请人 USHIO INC 发明人 NOZAWA SHIGENORI
分类号 G01N35/00;G01N21/03;G01N21/27;G01N35/08;G01N37/00 主分类号 G01N35/00
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