| 摘要 |
PROBLEM TO BE SOLVED: To prevent a decrease in work efficiency, suppress a decrease in yield and measure exact characteristics. SOLUTION: An apparatus 1 for measuring characteristics of a crystal oscillator is provided with a depressurization vessel 3 capable of containing a plurality of crystal oscillators and depressurizing inside, contact probes 15 and 16 arranged in the depressurization vessel 3 to contact electrodes provided to each crystal oscillator and a characteristics measuring part 8 for supplying exciting voltage by way of the contact probes 15 and 16 and measuring the oscillating frequency and equivalent series resistance of the crystal oscillators. COPYRIGHT: (C)2007,JPO&INPIT
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