发明名称 Automatic non-linear phase response calibration and compensation for a power measurement device
摘要 Phase delay compensation sweep may be used in determining correct phase delay compensation of measured currents for substantially matching a measured apparent power to an expected apparent power over an operating range of current values of a current transformer (CT). A frequency sweep may also be used in determining correct phase delay compensation of each measured current in applications having multiple frequencies. Phase delay compensation for each CT current value may be stored in a phase delay compensation look-up table during the phase delay compensation sweep calibration and recalled from the look-up table during operational power measurements. Phase delay compensation for each CT current value and each frequency of that current value may be stored in a phase delay compensation look-up table during the phase delay compensation sweep calibration and recalled from the look-up table during operational power measurements.
申请公布号 US2007007945(A1) 申请公布日期 2007.01.11
申请号 US20060502222 申请日期 2006.08.10
申请人 MICROCHIP TECHNOLOGY INCORPORATED 发明人 KING CRAIG L.;QUIQUEMPOIX VINCENT;BERRY ROGER
分类号 G01R11/32;G01R7/00;G01R25/00 主分类号 G01R11/32
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