发明名称 WAFER PROCESSING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a wafer processing method that does not disturb wafer handling such as wafer transportation and enables through-holes (via holes) to be easily created. <P>SOLUTION: This method is intended to handle a wafer that comprises a device area with multiple devices on its surface, and a residue area surrounding the device area and forms electrodes in the device area. This method comprises a step for removing an area corresponding to the device area at the backside of the wafer in a way that the device area can be of the predetermined thickness, a step for leaving an area corresponding to a residue area at the backside of the wafer in a way that a circular reinforced part can be formed, and a step for drilling a through-hole (via hole) in the corresponding wafer electrode where the above reinforced part has been formed. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007005666(A) 申请公布日期 2007.01.11
申请号 JP20050185974 申请日期 2005.06.27
申请人 DISCO ABRASIVE SYST LTD 发明人 KAJIYAMA KEIICHI;KONDO KOICHI;KANEUCHI YASUTOMI
分类号 H01L21/302;B23K26/38;B23K26/40;B23K101/40;H01L21/02;H01L21/304;H01L25/065;H01L25/07;H01L25/18 主分类号 H01L21/302
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