发明名称 |
SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF |
摘要 |
<p>A semiconductor device includes MOS transistors formed by doping a p-type substrate (4) with an impurity from its surface of. The semiconductor device comprises first and second MOS devices (1A, 1B) each having the p-type substrate (4) having the region directly below a gate layer (5) not doped with the impurity and an n-type diffusion region formed on the surface of the p-type substrate (4) circumscribed to the gate layer (5). The gate layer of the first MOS device (1A) is connected to the n-type diffusion layer of the second MOS device (1B), and the n-type diffusion layer of the first MOS device (1A) is connected to the gate layer of the second MOS device (1B), thereby constituting a first capacitance element.</p> |
申请公布号 |
WO2007004258(A1) |
申请公布日期 |
2007.01.11 |
申请号 |
WO2005JP12070 |
申请日期 |
2005.06.30 |
申请人 |
SPANSION JAPAN LIMITED;SPANSION LLC;SHIMBAYASHI, KOJI |
发明人 |
SHIMBAYASHI, KOJI |
分类号 |
H01L21/822;H01L21/8234;H01L21/8236;H01L27/04;H01L27/06;H01L27/088 |
主分类号 |
H01L21/822 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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