发明名称 TEST CLASSIFICATION SYSTEM OF ELECTRONIC COMPONENT
摘要 PROBLEM TO BE SOLVED: To provide a test classification system of electronic components which conducts electric characteristic test and visual inspection of electronic components such as small semiconductor, classifies into characteristic ranks and contains in a containing part. SOLUTION: The invention is constituted of a rotary disk having a plurality of slide grooves for grasping electronic components on the circle of a classification system, an electronic components chucking means and an electronic components exhaust means. When the rotary disk reaches a specific position, a plurality of the electronic components are forcedly exhausted simultaneously or with a shifted timing by compressed air, and the electronic components can be contained in specific container boxes set at characteristic ranks. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007003342(A) 申请公布日期 2007.01.11
申请号 JP20050183719 申请日期 2005.06.23
申请人 UENO SEIKI KK 发明人 NAGASATO SHOICHI
分类号 G01R31/26 主分类号 G01R31/26
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