发明名称 Method for fabricating semiconductor device
摘要 A method for fabricating a semiconductor device is provided. The method includes: loading a wafer into a chamber including a ceramic dome coated with a material having etch tolerance against a plasma; etching a gate structure formed on the wafer, thereby generating etch remnants; and removing the etch remnants by using a gas of SF<SUB>6 </SUB>as a main etch gas.
申请公布号 US2007010096(A1) 申请公布日期 2007.01.11
申请号 US20050282810 申请日期 2005.11.18
申请人 SHIN KYOUNG-CHOUL;MUN SEONG-YEOL 发明人 SHIN KYOUNG-CHOUL;MUN SEONG-YEOL
分类号 H01L21/302 主分类号 H01L21/302
代理机构 代理人
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