发明名称 Method and apparatus for forming silicon oxynitride film
摘要 A silicon oxynitride film is formed on a target substrate by CVD, in a process field configured to be selectively supplied with a first process gas containing a chlorosilane family gas, a second process gas containing an oxidizing gas, and a third process gas containing a nitriding gas. This method alternately includes first to sixth steps. The first, third, and fifth steps perform supply of the first, second, and third process gases, respectively, while stopping supply of the other two process gases. Each of the second, fourth, and sixth steps stops supply of the first to third process gases. The third and fifth steps include an excitation period of supplying the second and third process gases, respectively, to the process field while exciting the respective process gases by an exciting mechanism.
申请公布号 US2007010071(A1) 申请公布日期 2007.01.11
申请号 US20060478626 申请日期 2006.07.03
申请人 MATSUURA HIROYUKI 发明人 MATSUURA HIROYUKI
分类号 C23C16/00;B05C11/00;C23C16/42;G06F19/00;H01L21/20;H01L21/31;H01L21/318 主分类号 C23C16/00
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