| 摘要 |
A method of verifying a semiconductor integrated circuit according to the invention does not compare expected values based on a strobe every cycle but executes a verification on the basis of a signal transition (change) point. At the same time, the verifying method is intended for verifying a path in a circuit through which a signal transition (change) in a result to be output is sent, and can find the drawbacks of a circuit and a pattern in a more upstream process for a design with higher precision as compared with the conventional art so that quality of a design can be enhanced. By using information about the path through which the signal transition is output to carry out an inspection, moreover, it is possible to finally inspect (test) an LSI with high precision and quality.
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