发明名称 |
MEASURING METHOD AND INSTRUMENT EMPLOYING CRYSTAL OSCILLATOR |
摘要 |
Physical properties of an objective substance of measurement are measured exactly by measuring any one of a mass load, a viscous load and a viscoelastic load separately from other loads. The method for measuring the physical properties of a substance touching a crystal oscillator equipped with electrodes on the opposite sides of a quartz plate based on the frequency variation of the crystal oscillator, characterized in that the physical properties of the substance are measured by employing frequencies F<SUB>1</SUB> and F<SUB>2 </SUB>(F<SUB>1</SUB><F<SUB>2</SUB>) giving one half of the maximum conductance in the vicinity of a resonance point by each frequency of at least two out of N-multiple waves (N=1, 3, 5, ...(N=2n+1)) of the crystal oscillator when a voltage is applied between the electrodes. |
申请公布号 |
WO2007004376(A1) |
申请公布日期 |
2007.01.11 |
申请号 |
WO2006JP310974 |
申请日期 |
2006.06.01 |
申请人 |
ULVAC, INC.;ITOH, ATSUSHI;ICHIHASHI, MOTOKO |
发明人 |
ITOH, ATSUSHI;ICHIHASHI, MOTOKO |
分类号 |
G01N5/02 |
主分类号 |
G01N5/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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