A METHOD AND SYSTEM FOR PRODUCING SIGNALS TO TEST SEMICONDUCTOR DEVICES
摘要
A method of and system for producing signals to test semiconductor devices includes a pin electronic (PE) stage for providing a parametric measurement unit (PMU) current test signal to a semiconductor device under test. The PE stage also senses a response from the semiconductor device under test.
申请公布号
WO2006068937(A3)
申请公布日期
2007.01.11
申请号
WO2005US45606
申请日期
2005.12.16
申请人
TERADYNE, INC.;WALKER, ERNEST P.;SARTSCHEV, RONALD A.