发明名称 Metal-substituted transistor gates
摘要 One aspect of this disclosure relates to a method for forming an integrated circuit. According to various embodiments of the method, a plurality of transistors is formed. For each transistor, a gate dielectric is formed on a substrate, a substitutable structure is formed on the gate dielectric, and source/drain regions for the transistor are formed. At least two substitution processes are performed. Each substitution process includes substituting a desired gate material for the substitutable structure. Other aspects and embodiments are provided herein.
申请公布号 US2007010061(A1) 申请公布日期 2007.01.11
申请号 US20060444993 申请日期 2006.06.01
申请人 MICRON TECHNOLOGY, INC. 发明人 FORBES LEONARD;FARRAR PAUL A.;AHN KIE Y.
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
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