发明名称 |
TEMPERATURE MEASURING DEVICE, THERMAL TREATMENT DEVICE USING THE SAME, TEMPERATURE MEASURING METHOD |
摘要 |
<p>There are provided a temperature measuring device, method, and a thermal treatment device which are appropriately used for measuring a temperature of a substrate subjected to thermal treatment performing rapid heating. The temperature measuring device includes: a light intensity measuring unit for applying a laser beam to an object to be heated having a uniquely defined correlation between a temperature and a refractivity and measuring light intensity characteristic X indicating the relationship between a reflected light or a transmitting light obtained by interference of laser beams multiply reflected in the object to be heated and the time; a calculation unit for acquiring a reproduced object to be heated for obtaining a virtual object to be heated having light intensity characteristic Z nearest to the light intensity characteristic X obtained from the virtual object to be heated when applying a thermal load equivalent to the condition of heading the object to be heated and applying a laser beam having characteristic equivalent to the aforementioned leaser beam to the virtual object to be heated; and a temperature output unit for obtaining a temperature of a predetermined portion of the object to be heated at a predetermined time according to the reproduced object to be heated.</p> |
申请公布号 |
WO2007004644(A1) |
申请公布日期 |
2007.01.11 |
申请号 |
WO2006JP313304 |
申请日期 |
2006.07.04 |
申请人 |
HIROSHIMA UNIVERSITY;HIGASHI, SEIICHIRO |
发明人 |
HIGASHI, SEIICHIRO |
分类号 |
G01K11/12;G01K13/00;G06F17/30 |
主分类号 |
G01K11/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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