发明名称 INTERCONNECTION STRUCTURE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an interconnection structure and its manufacturing method capable of solving the problem of a signal delay, preventing a scratch or an exfoliation of a film of a first insulating film at the time of manufacturing, and manufacturing at low cost without increasing a manufacturing steps. SOLUTION: The method for manufacturing the interconnection structure comprises the steps of forming the first insulating film 101 at the predetermined region on a substrate 100; depositing a second insulating film 103 on the other region of the substrate and on the first insulating film, and planarizing so that the film thickness of the second insulating film on the first insulating film becomes 10 to 200 nm; respectively forming an interconnection groove 105 in a laminated region of the first insulating film and the second insulating film, and in a single layer region of the second insulating film; forming a diffusion preventing film on an inside surface of the interconnection groove; and depositing a metal film with its film thickness in which the interconnection groove of the second insulating film is completely filled up and forming an interconnection 106 in the interconnection groove by removing the metal film on the second insulating film. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007005628(A) 申请公布日期 2007.01.11
申请号 JP20050185125 申请日期 2005.06.24
申请人 SHARP CORP 发明人 AZUMA KENICHI
分类号 H01L21/768;H01L23/522 主分类号 H01L21/768
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