发明名称 Semiconductor device with effective heat-radiation
摘要 The semiconductor device has a silicon layer (SOI layer) ( 12 ) formed through a silicon oxide film ( 11 ) on a support substrate ( 10 ). A transistor (T 1 ) is formed in the SOI layer ( 12 ). The wiring ( 17 a) is connected with a source of the transistor (T 1 ) through a contact plug ( 15 a). A back metal ( 18 ) is formed on an under surface (back surface) of the support substrate ( 10 ) and said back metal ( 18 ) is connected with the wiring ( 17 a) through a heat radiating plug ( 16 ). The contact plug ( 15 a), the heat radiating plug ( 16 ) the wiring ( 17 a) and the back metal ( 18 ) is made of a metal such as aluminum, tungsten and so on which has a higher thermal conductivity than that of the silicon oxide film ( 11 ) and the support substrate ( 10 ).
申请公布号 US2007007595(A1) 申请公布日期 2007.01.11
申请号 US20060520640 申请日期 2006.09.14
申请人 RENESAS TECHNOLOGY CORP. 发明人 HIRANO YUUICHI;MAEDA SHIGENOBU;MATSUMOTO TAKUJI;IPPOSHI TAKASHI;MAEGAWA SHIGETO
分类号 H01L21/28;H01L27/12;H01L21/3205;H01L21/822;H01L21/8238;H01L21/84;H01L23/38;H01L23/52;H01L27/00;H01L27/01;H01L27/04;H01L27/06;H01L27/08;H01L27/092;H01L29/786;H01L35/28 主分类号 H01L21/28
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