发明名称 |
Semiconductor device with effective heat-radiation |
摘要 |
The semiconductor device has a silicon layer (SOI layer) ( 12 ) formed through a silicon oxide film ( 11 ) on a support substrate ( 10 ). A transistor (T 1 ) is formed in the SOI layer ( 12 ). The wiring ( 17 a) is connected with a source of the transistor (T 1 ) through a contact plug ( 15 a). A back metal ( 18 ) is formed on an under surface (back surface) of the support substrate ( 10 ) and said back metal ( 18 ) is connected with the wiring ( 17 a) through a heat radiating plug ( 16 ). The contact plug ( 15 a), the heat radiating plug ( 16 ) the wiring ( 17 a) and the back metal ( 18 ) is made of a metal such as aluminum, tungsten and so on which has a higher thermal conductivity than that of the silicon oxide film ( 11 ) and the support substrate ( 10 ).
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申请公布号 |
US2007007595(A1) |
申请公布日期 |
2007.01.11 |
申请号 |
US20060520640 |
申请日期 |
2006.09.14 |
申请人 |
RENESAS TECHNOLOGY CORP. |
发明人 |
HIRANO YUUICHI;MAEDA SHIGENOBU;MATSUMOTO TAKUJI;IPPOSHI TAKASHI;MAEGAWA SHIGETO |
分类号 |
H01L21/28;H01L27/12;H01L21/3205;H01L21/822;H01L21/8238;H01L21/84;H01L23/38;H01L23/52;H01L27/00;H01L27/01;H01L27/04;H01L27/06;H01L27/08;H01L27/092;H01L29/786;H01L35/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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