发明名称 |
CIRCUIT TESTING APPARATUS, CIRCUIT TESTING METHOD, AND SIGNAL DISTRIBUTING METHOD THEREFOR |
摘要 |
<p>A circuit to be verified is divided into a plurality of circuit parts. A plurality of programmable devices are provided for implementing functional operation of the divided circuit parts through a simulation. Wiring used in the circuit to be verified for supplying a signal S X to be given at the same time to the plurality of programmable devices is provided so that a maximum skew of time at which the signal S X arrives at the plurality of programmable devices is less than a minimum time required for data transfer between the programmable devices. An input terminal PX for inputting the signal S x from a signal generation device (400) is implemented in each of the programmable devices. The signal S X can be inputted directly from the signal generation device, and a skew can be inhibited from being produced.</p> |
申请公布号 |
EP1742365(A1) |
申请公布日期 |
2007.01.10 |
申请号 |
EP20050721706 |
申请日期 |
2005.03.29 |
申请人 |
NEC CORPORATION |
发明人 |
HOSOKAWA, KOUHEI |
分类号 |
G01R31/319;G01R31/28;G06F1/10;G06F17/50;H03K19/173 |
主分类号 |
G01R31/319 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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