发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE HAVING WCN LAYER
摘要 A method for manufacturing a semiconductor device having a WCN layer is provided to increase work function of a gate electrode by thermally decomposing a source gas to form the WCN layer. A high-k dielectric(204) is formed on a substrate(200). A source gas containing a tungsten amine derivative is introduced to the high-k dielectric. The source gas is thermally decomposed to form a WCN layer(206) on the high-k dielectric. The WCN layer is patterned to form a gate electrode. The tungsten amine derivative includes a bis(tert-butylimido)bis(dimetylamido)W. A carrier gas is used for introducing the source gas to the substrate. A pressure control gas is introduced to control pressure in an active chamber for forming the WCN layer.
申请公布号 KR100666917(B1) 申请公布日期 2007.01.10
申请号 KR20050116754 申请日期 2005.12.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEON, TAEK SOO;CHO, HAG JU;LEE, HYE LAN;SHIN, YU GYUN;KANG, SANG BOM
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
主权项
地址