发明名称 Ion trap/time-of-flight mass spectrometer and method of measuring ion accurate mass
摘要 An ion trap/time-of-flight mass spectrometer, which can perform accurate mass measurement of a product ion based on MS/MS and MS<SUP>n </SUP>has an ion source for ionizing a sample, an ion trap capable of temporarily trapping ions, and a time-of-flight mass spectrometer. The ion source produces ions of the sample as a measurement target and ions of a reference sample each having a known mass value. A precursor ion is selected from among the ions of the measurement target sample, and the selected precursor ion is excited and fragmented in the ion trap to produce a product ion. The reference sample ions are introduced to and trapped in the ion trap. The trapped product ion and reference sample ions are expelled out of the ion trap and introduced to the time-of-flight mass spectrometer, thereby obtaining a mass spectrum.
申请公布号 US7161141(B2) 申请公布日期 2007.01.09
申请号 US20050128261 申请日期 2005.05.13
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 MIMURA TADAO;KATO YOSHIAKI;OKUMOTO TOYOHARU
分类号 B01D59/44;G01N27/62;G01D18/00;G01N30/72;G12B13/00;H01J49/00;H01J49/26;H01J49/40;H01J49/42 主分类号 B01D59/44
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