发明名称 X-ray detector with increased detective quantum efficiency
摘要 An x-ray detector having an increased DQE (detective quantum efficiency) is provided. The x-ray detector includes a scintillator for converting incident x-ray photons into optical photons, and an epitaxial p-i-n photodiode for converting these optical photons into an electric signal. The epitaxial photodiode includes a low resistivity N<SUP>+</SUP> type silicon substrate; a high-resistivity, N-type epitaxial layer that forms the intrinsic region of the photodiode; and a light-receiving P<SUP>+</SUP> type layer. The resistivity of the N<SUP>+</SUP> layer is sufficiently low, so that the diffusion lengths of the charge carriers that are formed in the N<SUP>+</SUP> layer by direct conversion of x-rays are small enough to allow these charge carriers to recombine before reaching the pn junction. The resistivity of the epitaxial N-layer is high enough so that the collection efficiency of the output signal resulting from the electron-hole pairs created through absorption of the optical photons in the depletion region is not impaired.
申请公布号 US7161155(B1) 申请公布日期 2007.01.09
申请号 US20040876069 申请日期 2004.06.24
申请人 ANALOGIC CORPORATION 发明人 DEYCH RUVIN
分类号 G01T1/20 主分类号 G01T1/20
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