发明名称 Impedance analyzer
摘要 An impedance analyzer includes a reference signal, a first converter a first coupler, a second converter, a second coupler, a modification circuit, a reference signal detector, and a reflected signal detector. The first coupler couples the reference signal to the first converter. The first converter produces a reference intermediate frequency signal. The second coupler couples a reflected signal to the second converter. The second converter produces a reflected intermediate frequency signal. A reflection coefficient for a device under test is determined by using a reflected value detected by the reflected signal detector and a reference value detected by the reference signal detector. In a first operating mode of the impedance analyzer, the reflected intermediate frequency signal is forwarded directly to the reflected signal detector. In a second operating mode of the impedance analyzer, the modification circuit operates on the reference intermediate frequency signal to produce an adjustment signal that is combined with the reflected intermediate frequency signal before a resulting signal is forwarded to the reflected signal detector.
申请公布号 US7161358(B1) 申请公布日期 2007.01.09
申请号 US20060374502 申请日期 2006.03.13
申请人 AGILENT TECHNOLOGIES, INC. 发明人 TANBAKUCHI HASSAN;BETTS LOREN COLE;BLACKHAM DAVID
分类号 G01R27/02 主分类号 G01R27/02
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