发明名称 Microfabrication process for control of waveguide gap size
摘要 A method for forming a gap ( 16 ) of a width (d) which meets selected tolerance limits includes forming sidewalls ( 80, 82 ) in a microstructure, the sidewalls defining a gap ( 16 ) therebetween. The gap has a width defined between the sidewalls. The width of the gap between the sidewalls is determined. Where the determined width of the gap is below the selected tolerance limits for the width of the gap, the sidewalls are consumed to form a gap which meets the selected tolerance limits. The gap may be incorporated in a waveguide device ( 10 ) of a microswitch ( 100 ) and selectively connect input and output waveguides ( 130, 132 ).
申请公布号 US7162112(B2) 申请公布日期 2007.01.09
申请号 US20040995965 申请日期 2004.11.23
申请人 XEROX CORPORATION 发明人 LIN PINYEN;KUBBY JOEL A.;WANG YAO RONG
分类号 G02B6/12;G02B6/00;G02B6/10;H01L21/00 主分类号 G02B6/12
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