发明名称 SEMICONDUCTOR LIGHT DETECTING ELEMENT AND MANUFACTURING METHOD THEREOF
摘要 A semiconductor light detecting element (PD1) is provided with a multilayer structure (LS1) and a glass board (1) which is optically transparent to incident light. The multilayer structure includes a stacked etching stopping layer (2), an n-type high concentration carrier layer (3), an n-type light absorbing layer (5) and an n-type cap layer (7). In the vicinity of a first main surface (101) of the multilayer structure, a light receiving region (9) is formed, and on the first main surface, a first electrode (21) is provided. On a second main surface (102), a second electrode (27) and a third electrode (31) are provided. On the first main surface, a film (10) which covers the light receiving region and the first electrode is formed. On a front surface (10a) of the film, the glass board (1) is fixed. ® KIPO & WIPO 2007
申请公布号 KR20070004918(A) 申请公布日期 2007.01.09
申请号 KR20067022520 申请日期 2006.10.27
申请人 HAMAMATSU PHOTONICS K.K. 发明人 TANAKA AKIMASA
分类号 H01L27/146;H01L31/10;H01L27/14;H01L31/02 主分类号 H01L27/146
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