发明名称 CIRCUIT FOR DETECTING A DEFECTIVE REPAIR FUSE IN SEMICONDUCTOR DEVICE
摘要 A repair fuse error detection circuit of a semiconductor device is provided to prevent an operation error of the semiconductor device using a repair fuse, by accurately detecting the state of the repair fuse. A repair fuse error detection circuit includes a repair fuse(110). A pull-up transistor(PM) is connected between a power supply stage and an input stage of the repair fuse, and transfer a power supply voltage to the input stage of the repair fuse according to a precharge signal inputted to a gate. A first latch part(120) is connected to the input stage of the repair fuse to latch the input stage potential of the repair fuse. A pull-down transistor(NM) is connected between a ground stage and an output stage of the repair fuse, and transfers a current flowing through the repair fuse to the ground stage according to a control signal inputted to a gate. A second latch part(130) is connected to the output stage of the repair fuse, and latches the output stage potential of the repair fuse.
申请公布号 KR20070002324(A) 申请公布日期 2007.01.05
申请号 KR20050057807 申请日期 2005.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SHIN, MIN SU
分类号 G11C29/00 主分类号 G11C29/00
代理机构 代理人
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