发明名称 SEMICONDUCTOR STORAGE DEVICE HAVING MEMORY CELL FOR STORING DATA BY USING DIFFERENCE IN THRESHOLD VOLTAGE
摘要 A semiconductor storage device having a memory cell using threshold voltage difference to record data is provided to prevent read operation error due to indistinctness of threshold voltage without widening a threshold voltage window, by increasing a read voltage margin for the distribution of the threshold voltage. A plurality of memory cells store data by using a threshold voltage difference. At least one reference memory cell stores data indicating the state of the corresponding memory cell by using the threshold voltage difference. A control circuit(11) determines a read voltage on the basis of data stored in the memory cell and the reference memory cell corresponding to the memory cell. A read part(50) reads the memory cell by using the determined read voltage. A write part(50) writes data indicating that a memory cell for writing is in a write state, into the reference memory cell corresponding to the memory cell for writing, when the memory cell is already written.
申请公布号 KR20070003639(A) 申请公布日期 2007.01.05
申请号 KR20060059528 申请日期 2006.06.29
申请人 RENESAS TECHNOLOGY CORP. 发明人 OKAYAMA SHOTA;MATSUBARA KEN
分类号 G11C17/00 主分类号 G11C17/00
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