发明名称 LATENCY CONTROL CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE
摘要 A latency control circuit of a semiconductor memory device is provided to improve operation performance by changing latency according to refresh during a burst read operation in a synchronous pseudo SRAM. A precharge part(10) outputs a precharge reset signal to extend latency during a burst read period where a refresh operation is performed according to a refresh signal and a normal active signal. A refresh period detection part(20) detects a refresh period according to the precharge reset signal and a latency setting signal including the latency extension information, and then enables a latency extension signal during the burst read period, and disables the latency extension signal when the precharge reset signal is enabled. A latency decoder(30) outputs a latency pre-signal including latency information fixed by decoding an external address. A latency control part(40) outputs a fixed latency signal according to the latency pre-signal during a period where the refresh operation is not performed, and extends the cycle of the latency signal according to the latency extension signal during a period where the refresh operation is performed.
申请公布号 KR20070002838(A) 申请公布日期 2007.01.05
申请号 KR20050058521 申请日期 2005.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, YIN JAE
分类号 G11C11/4193;G11C11/4076 主分类号 G11C11/4193
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