发明名称 METHOD FOR FABRICATING FLASH MEMORY DEVICE
摘要 <p>A method for manufacturing a flash memory device is provided to improve data retention property by removing mobile ions using a cleaning process containing carboxylic acid(R-COOH). A gate stack(46) is formed on an active region of a substrate(40) defined by an isolation layer. A spacer(47) is formed at both sidewalls of the gate stack. A stopping nitride layer(48) is formed on the resultant structure. An interlayer dielectric(49) is formed on the stopping nitride layer. A contact is formed to connect the substrate through the interlayer dielectric. After the interlayer dielectric or a contact hole is formed, a cleaning process is performed by using a cleaning solution containing carboxylic acids.</p>
申请公布号 KR20070002414(A) 申请公布日期 2007.01.05
申请号 KR20050057949 申请日期 2005.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, SE JUN
分类号 H01L27/115 主分类号 H01L27/115
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