发明名称 LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
摘要 <p>A lithographic apparatus and a device manufacturing method are provided to treat stably a variety of substrates including a non-standard substrate without a large deformation of the lithographic apparatus or a treatment station, to improve the exactness of alignment of the non-standard substrate and to reduce the contamination of the treatment station. A lithographic apparatus includes a substrate table and a projection system. The substrate table is used for supporting a first substrate(1) of a first type. The substrate table has a polished surface. The projection system is used for projecting a patterned radiation beam onto a target portion of the first substrate. The polished surface is capable of supporting a second substrate(2) of a second type. The projection system is capable of projecting the patterned radiation beam onto the second substrate.</p>
申请公布号 KR20070003694(A) 申请公布日期 2007.01.05
申请号 KR20060060984 申请日期 2006.06.30
申请人 ASML NETHERLANDS B.V. 发明人 VAN DE MOOSDIJK MICHAEL JOSEPHUS EVERT;SIMON KLAUS;DE LAAT WILHELMUS JOHANNES MARIA
分类号 H01L21/027 主分类号 H01L21/027
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