| 摘要 |
A semiconductor memory device is provided to easily monitor a self refresh period in a test mode, by performing self refresh period analysis by using a tester of an oscilloscope. An oscillation unit(100) generates a self refresh start signal and a self refresh period pulse having a certain period from the self refresh start signal in response to a self refresh signal. A shift register(200) generates a self refresh period level signal maintaining different levels at every self refresh period defined by the self refresh start signal and the self refresh period pulse in response to a test mode signal. A multiplexer unit(300) selectively outputs a data signal and the self refresh period level signal in response to the test mode signal. A data output buffer(400) buffers an output signal of the multiplexer unit.
|
