发明名称 Semiconductor storage device having memory cell for storing data by using difference in threshold voltage
摘要 A semiconductor storage device which includes a memory array including a plurality of memory cells for storing data by using a difference in a threshold voltage and at least one reference cell for storing data indicative of a state of a corresponding memory cell by using a difference in a threshold voltage, a control circuit for determining a read voltage based on data stored by a reference cell corresponding to a memory cell adjacent to a memory cell to be read, a read unit for executing reading from a memory cell to be read by using a determined read voltage, and a write unit for executing writing, when executing writing to a memory cell to be written to bring the memory cell into a written state, data indicating that the memory cell is in the written state to a reference cell corresponding to the memory cell.
申请公布号 US2007002632(A1) 申请公布日期 2007.01.04
申请号 US20060475189 申请日期 2006.06.27
申请人 RENESAS TECHNOLOGY CORP. 发明人 OKAYAMA SHOTA;MATSUBARA KEN
分类号 G11C11/34 主分类号 G11C11/34
代理机构 代理人
主权项
地址