发明名称 |
Method and apparatus for detecting overlapped substrates |
摘要 |
An apparatus and method for detection of overlapped substrates, that are at least opaque, analyses a high frequency component caused by speckle for a sudden drop therein. This high frequency component drops dramatically when overlapped substrates are present and therefore allows fast accurate recognition of an overlapped substrate condition. This is useful in many applications including banknote validators. |
申请公布号 |
AU2006264172(A1) |
申请公布日期 |
2007.01.04 |
申请号 |
AU20060264172 |
申请日期 |
2006.06.28 |
申请人 |
CRANE CANADA CO. |
发明人 |
LEON SALTSOV;BOGDAN MISHUNIN;MYKHAYLO BAZHENOV;VOLODYMYR BARCHUK;OLEKSANDR SOYFER;DMITRO BAYDIN |
分类号 |
G01N21/892;B65H7/12;G01B11/30;G07D7/12 |
主分类号 |
G01N21/892 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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