发明名称 |
DOPING PROFILE IMPROVEMENT OF IN-SITU DOPED N-TYPE EMITTERS |
摘要 |
A method for forming an emitter-base junction. The method includes the steps of: providing a base layer (26); and growing a doped mono-emitter layer (28) on the base layer (26) using a gas flow comprised of a set of process gases, wherein gas flow includes an addition of a germanium (Ge) source to the process gases for the first few seconds of the gas flow. |
申请公布号 |
WO2007000718(A2) |
申请公布日期 |
2007.01.04 |
申请号 |
WO2006IB52101 |
申请日期 |
2006.06.26 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS, N.V.;DE BOER, WIEBE |
发明人 |
DE BOER, WIEBE |
分类号 |
H01L21/331;H01L29/08;H01L29/10 |
主分类号 |
H01L21/331 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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