发明名称 DOPING PROFILE IMPROVEMENT OF IN-SITU DOPED N-TYPE EMITTERS
摘要 A method for forming an emitter-base junction. The method includes the steps of: providing a base layer (26); and growing a doped mono-emitter layer (28) on the base layer (26) using a gas flow comprised of a set of process gases, wherein gas flow includes an addition of a germanium (Ge) source to the process gases for the first few seconds of the gas flow.
申请公布号 WO2007000718(A2) 申请公布日期 2007.01.04
申请号 WO2006IB52101 申请日期 2006.06.26
申请人 KONINKLIJKE PHILIPS ELECTRONICS, N.V.;DE BOER, WIEBE 发明人 DE BOER, WIEBE
分类号 H01L21/331;H01L29/08;H01L29/10 主分类号 H01L21/331
代理机构 代理人
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