发明名称 Werkwijzen en systeem voor het onderdrukken van defectvorming bij immersielithografie.
摘要 An immersion lithography system includes an immersion fluid holder for containing an immersion fluid. The system further includes a stage for positioning a resist-coated semiconductor wafer in the immersion fluid holder and a lens proximate to the immersion fluid holder and positionable for projecting an image through the immersion fluid and onto the resist-coated semiconductor wafer. The immersion fluid holder includes a coating configured to reduce contaminate adhesion from contaminates in the immersion fluid.
申请公布号 NL1032092(A1) 申请公布日期 2007.01.04
申请号 NL20061032092 申请日期 2006.06.29
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHING-YU CHANG;BURN JENG LIN
分类号 G03F7/20;H01L21/027 主分类号 G03F7/20
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